Please use this identifier to cite or link to this item: https://hdl.handle.net/2440/108192
Citations
Scopus Web of Science® Altmetric
?
?
Type: Conference paper
Title: Losses in substrate integrated waveguide band-pass post filters
Author: Zhao, C.
Fumeaux, C.
Lim, C.
Citation: Proceedings of the 2015 Asia-Pacific Microwave Conference, 2015 / Hong, W., Zhu, X., Yang, G., Song, Z., Meng, F. (ed./s), vol.2, pp.1-3
Publisher: IEEE
Issue Date: 2015
Series/Report no.: Asia Pacific Microwave Conference-Proceedings
ISBN: 978-1-4799-8765-8
Conference Name: 2015 Asia-Pacific Microwave Conference (APMC 2015) (6 Dec 2015 - 9 Dec 2015 : Nanjing, China)
Editor: Hong, W.
Zhu, X.
Yang, G.
Song, Z.
Meng, F.
Statement of
Responsibility: 
Cheng Zhao, Christophe Fumeaux, and Cheng-Chew Lim
Abstract: Insertion loss is a crucial specification to judge the quality of a substrate integrated waveguide (SIW) band-pass filter. In this paper, six Chebyshev band-pass post filters in SIW technology are firstly designed with a lossless mode-matching code. The considered filters are designed with various orders for a center frequency of 10.5 GHz and a fractional bandwidth of 9.52%. These filters are then simulated with a full-wave electromagnetic solver in order to investigate the various contributions of ohmic and dielectric losses affecting the performance. In particular, the influence on the insertion loss of the variations of the metal cladding and vias conductivity, the dielectric loss tangent and the thickness of the substrate is quantitatively analyzed. For validation, one prototype filter is fabricated to compare the simulations to experimental results.
Keywords: Chebyshev filters, band-pass filter, substrate integrated waveguide
Rights: © 2015 IEEE
DOI: 10.1109/APMC.2015.7413143
Appears in Collections:Aurora harvest 8
Electrical and Electronic Engineering publications

Files in This Item:
File Description SizeFormat 
RA_hdl_108192.pdf
  Restricted Access
Restricted Access239.99 kBAdobe PDFView/Open


Items in DSpace are protected by copyright, with all rights reserved, unless otherwise indicated.