Please use this identifier to cite or link to this item: http://hdl.handle.net/2440/111150
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Type: Journal article
Title: Solution based methods for the fabrication of carbon nanotube modified atomic force microscopy probes
Author: Slattery, A.
Shearer, C.
Shapter, J.
Quinton, J.
Gibson, C.
Citation: Nanomaterials, 2017; 7(11):346-1-346-13
Publisher: MDPI AG
Issue Date: 2017
ISSN: 2079-4991
2079-4991
Statement of
Responsibility: 
Ashley D. Slattery, Cameron J. Shearer, Joseph G. Shapter, Jamie S. Quinton and Christopher T. Gibson
Abstract: High aspect ratio carbon nanotubes are ideal candidates to improve the resolution and lifetime of atomic force microscopy (AFM) probes. Here, we present simple methods for the preparation of carbon nanotube modified AFM probes utilising solvent evaporation or dielectrophoresis. Scanning electron microscopy (SEM) of the modified probes shows that the carbon nanotubes attach to the probe apex as fibres and display a high aspect ratio. Many of the probes made in this manner were initially found to exhibit anomalous feedback characteristics during scanning, which rendered them unsuitable for imaging. However, we further developed and demonstrated a simple method to stabilise the carbon nanotube fibres by scanning with high force in tapping mode, which either shortens or straightens the carbon fibre, resulting in stable and high quality imaging AFM imaging.
Keywords: Atomic force microscopy; carbon nanotubes; dielectrophoresis
Rights: © 2017 by the authors. Licensee MDPI, Basel, Switzerland. This article is an open access article distributed under the terms and conditions of the Creative Commons Attribution (CC BY) license (http://creativecommons.org/licenses/by/4.0/).
RMID: 0030080246
DOI: 10.3390/nano7110346
Grant ID: http://purl.org/au-research/grants/arc/DP150101354
http://purl.org/au-research/grants/arc/DP160101301
Appears in Collections:Chemical Engineering publications

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