Please use this identifier to cite or link to this item: http://hdl.handle.net/2440/112168
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Type: Journal article
Title: Accurate measurement of Atomic Force Microscope cantilever deflection excluding tip-surface contact with application to force calibration
Author: Slattery, A.
Blanch, A.
Quinton, J.
Gibson, C.
Citation: Ultramicroscopy, 2013; 131:46-55
Publisher: Elsevier
Issue Date: 2013
ISSN: 0304-3991
1879-2723
Statement of
Responsibility: 
Ashley D. Slattery, Adam J. Blanch, Jamie S. Quinton, Christopher T. Gibson
Abstract: Abstract not available
Keywords: Cantilever; sensitivity; calibration; AFM; focused ion beam; thermal noise
Rights: © 2013 Elsevier B.V. All rights reserved.
RMID: 0030079948
DOI: 10.1016/j.ultramic.2013.03.009
Appears in Collections:Chemical Engineering publications

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