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Please use this identifier to cite or link to this item: https://hdl.handle.net/2440/112168
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dc.contributor.authorSlattery, A.-
dc.contributor.authorBlanch, A.-
dc.contributor.authorQuinton, J.-
dc.contributor.authorGibson, C.-
dc.date.issued2013-
dc.identifier.citationUltramicroscopy, 2013; 131:46-55-
dc.identifier.issn0304-3991-
dc.identifier.issn1879-2723-
dc.identifier.urihttp://hdl.handle.net/2440/112168-
dc.description.abstractAbstract not available-
dc.description.statementofresponsibilityAshley D. Slattery, Adam J. Blanch, Jamie S. Quinton, Christopher T. Gibson-
dc.language.isoen-
dc.publisherElsevier-
dc.rights© 2013 Elsevier B.V. All rights reserved.-
dc.source.urihttp://dx.doi.org/10.1016/j.ultramic.2013.03.009-
dc.subjectCantilever; sensitivity; calibration; AFM; focused ion beam; thermal noise-
dc.titleAccurate measurement of Atomic Force Microscope cantilever deflection excluding tip-surface contact with application to force calibration-
dc.typeJournal article-
dc.identifier.doi10.1016/j.ultramic.2013.03.009-
pubs.publication-statusPublished-
dc.identifier.orcidSlattery, A. [0000-0003-4023-3506]-
Appears in Collections:Aurora harvest 3
Chemical Engineering publications

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