Please use this identifier to cite or link to this item: http://hdl.handle.net/2440/112168
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dc.contributor.authorSlattery, A.en
dc.contributor.authorBlanch, A.en
dc.contributor.authorQuinton, J.en
dc.contributor.authorGibson, C.en
dc.date.issued2013en
dc.identifier.citationUltramicroscopy, 2013; 131:46-55en
dc.identifier.issn0304-3991en
dc.identifier.issn1879-2723en
dc.identifier.urihttp://hdl.handle.net/2440/112168-
dc.description.abstractAbstract not availableen
dc.description.statementofresponsibilityAshley D. Slattery, Adam J. Blanch, Jamie S. Quinton, Christopher T. Gibsonen
dc.language.isoenen
dc.publisherElsevieren
dc.rights© 2013 Elsevier B.V. All rights reserved.en
dc.subjectCantilever; sensitivity; calibration; AFM; focused ion beam; thermal noiseen
dc.titleAccurate measurement of Atomic Force Microscope cantilever deflection excluding tip-surface contact with application to force calibrationen
dc.typeJournal articleen
dc.identifier.rmid0030079948en
dc.identifier.doi10.1016/j.ultramic.2013.03.009en
dc.identifier.pubid391755-
pubs.library.collectionChemical Engineering publicationsen
pubs.library.teamDS14en
pubs.verification-statusVerifieden
pubs.publication-statusPublisheden
dc.identifier.orcidSlattery, A. [0000-0003-4023-3506]en
Appears in Collections:Chemical Engineering publications

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