Please use this identifier to cite or link to this item: https://hdl.handle.net/2440/113799
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Type: Journal article
Title: A new thermographic NDT for condition monitoring of electrical components using ANN with confidence level analysis
Author: Huda, A.
Taib, S.
Ghazali, K.
Jadin, M.
Citation: ISA Transactions, 2014; 53(3):717-724
Publisher: Elsevier
Issue Date: 2014
ISSN: 0019-0578
Statement of
Responsibility: 
A.S.N.Huda, S.Taib, K.H.Ghazali, M.S.Jadin
Abstract: Abstract not available
Keywords: Condition; MLP network; confidence level; infrared thermography; electrical components
Rights: © 2014 ISA.Published by Elsevier Ltd. All rights reserved.
DOI: 10.1016/j.isatra.2014.02.003
Appears in Collections:Aurora harvest 8
Electrical and Electronic Engineering publications

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