Please use this identifier to cite or link to this item: https://hdl.handle.net/2440/113799
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dc.contributor.authorHuda, A.-
dc.contributor.authorTaib, S.-
dc.contributor.authorGhazali, K.-
dc.contributor.authorJadin, M.-
dc.date.issued2014-
dc.identifier.citationISA Transactions, 2014; 53(3):717-724-
dc.identifier.issn0019-0578-
dc.identifier.urihttp://hdl.handle.net/2440/113799-
dc.description.abstractAbstract not available-
dc.description.statementofresponsibilityA.S.N.Huda, S.Taib, K.H.Ghazali, M.S.Jadin-
dc.language.isoen-
dc.publisherElsevier-
dc.rights© 2014 ISA.Published by Elsevier Ltd. All rights reserved.-
dc.subjectCondition; MLP network; confidence level; infrared thermography; electrical components-
dc.titleA new thermographic NDT for condition monitoring of electrical components using ANN with confidence level analysis-
dc.typeJournal article-
dc.identifier.doi10.1016/j.isatra.2014.02.003-
pubs.publication-statusPublished-
Appears in Collections:Aurora harvest 8
Electrical and Electronic Engineering publications

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