Please use this identifier to cite or link to this item: https://hdl.handle.net/2440/115335
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Type: Journal article
Title: Carbon nanotube modified probes for stable and high sensitivity conductive atomic force microscopy
Author: Slattery, A.
Shearer, C.
Gibson, C.
Shapter, J.
Lewis, D.
Stapleton, A.
Citation: Nanotechnology, 2016; 27(47):475708-1-475708-8
Publisher: IOP Publishing
Issue Date: 2016
ISSN: 0957-4484
1361-6528
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Responsibility: 
Ashley D Slattery, Cameron J Shearer, Christopher T Gibson, Joseph G Shapter, David A Lewis and Andrew J Stapleton
Abstract: Conductive atomic force microscopy (C-AFM) is used to characterise the nanoscale electrical properties of many conducting and semiconducting materials. We investigate the effect of single walled carbon nanotube (SWCNT) modification of commercial Pt/Ir cantilevers on the sensitivity and image stability during C-AFM imaging. Pt/Ir cantilevers were modified with small bundles of SWCNTs via a manual attachment procedure and secured with a conductive platinum pad. AFM images of topography and current were collected from heterogeneous polymer and nanomaterial samples using both standard and SWCNT modified cantilevers. Typically, achieving a good current image comes at the cost of reduced feedback stability. In part, this is due to electrostatic interaction and increased tip wear upon applying a bias between the tip and the sample. The SWCNT modified tips displayed superior current sensitivity and feedback stability which, combined with superior wear resistance of SWCNTs, is a significant advancement for C-AFM.
Rights: © 2016 IOP Publishing Ltd
DOI: 10.1088/0957-4484/27/47/475708
Appears in Collections:Aurora harvest 8
Chemical Engineering publications

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