Please use this identifier to cite or link to this item:
|Scopus||Web of Science®||Altmetric|
|Title:||Carbon nanotube modified probes for stable and high sensitivity conductive atomic force microscopy|
|Citation:||Nanotechnology, 2016; 27(47):475708-1-475708-8|
|Ashley D Slattery, Cameron J Shearer, Christopher T Gibson, Joseph G Shapter, David A Lewis and Andrew J Stapleton|
|Abstract:||Conductive atomic force microscopy (C-AFM) is used to characterise the nanoscale electrical properties of many conducting and semiconducting materials. We investigate the effect of single walled carbon nanotube (SWCNT) modification of commercial Pt/Ir cantilevers on the sensitivity and image stability during C-AFM imaging. Pt/Ir cantilevers were modified with small bundles of SWCNTs via a manual attachment procedure and secured with a conductive platinum pad. AFM images of topography and current were collected from heterogeneous polymer and nanomaterial samples using both standard and SWCNT modified cantilevers. Typically, achieving a good current image comes at the cost of reduced feedback stability. In part, this is due to electrostatic interaction and increased tip wear upon applying a bias between the tip and the sample. The SWCNT modified tips displayed superior current sensitivity and feedback stability which, combined with superior wear resistance of SWCNTs, is a significant advancement for C-AFM.|
|Rights:||© 2016 IOP Publishing Ltd|
|Appears in Collections:||Aurora harvest 8|
Chemical Engineering publications
Files in This Item:
There are no files associated with this item.
Items in DSpace are protected by copyright, with all rights reserved, unless otherwise indicated.