Accuracy of milled titanium frameworks constructed with splinted impression and direct scanning techniques

Abstract

Purpose: To compare vertical microgaps of milled titanium implant frameworks constructed using (1) direct model scanning (DMS) and (2) splinted impression (SIM) techniques. Materials and Methods: Three BioHorizon external hex implants were embedded in an epoxy resin model, and convenience samples of four identical frameworks in the DMS group and five in the SIM group were constructed. Implant-framework interfaces were scanned with a microcomputed tomography (CT) scanner, and the vertical microgap measured with one-screw and two-screw tests using CT analyzer (CTAn) software. Results: The mean maximum vertical microgap measured using the one-screw test was 13.25 μm in the DMS group and 72.40 μm in the SIM group (P < .0001). The mean maximum vertical microgap measured using the two-screw test was 10.5 μm in the DMS group and 36.2 μm in the SIM group (P = .0002). Conclusion: The milled titanium frameworks produced from direct scanning of implants had a smaller vertical microgap than frameworks produced from splinted impressions and master models.