Please use this identifier to cite or link to this item: https://hdl.handle.net/2440/123177
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Type: Conference paper
Title: Frustrated tunnel ionization in the few-cycle regime
Author: Glover, R.D.
Chetty, D.
Palmer, A.J.
Deharak, B.A.
Holdsworth, J.L.
Dakka, M.A.
Luiten, A.N.
Light, P.S.
Litvinyuk, I.V.
Sang, R.T.
Citation: Optics InfoBase Conference Papers, 2018, vol.JW3A.54, pp.1-2
Publisher: The Optical Society
Issue Date: 2018
Series/Report no.: OSA Technical Digest; JW3A.54
ISBN: 1943580464
9781943580460
Conference Name: Frontiers in Optics / Laser Science (16 Sep 2018 - 20 Sep 2018 : Washington, DC, United States)
Statement of
Responsibility: 
R. D. Glover, D. Chetty, B. A. deHarak, A. J. Palmer, M. A. Dakka, J. L. Holdsworth, I. V. Litvinyuk, A. N. Luiten, P. S. Light, R. T. Sang
Abstract: Frustrated tunnel ionization (FTI) is one of the dominant channels in strong field ionization that results in the excitation of atoms. Recent studies have shown that there is a significant number of FTI events for multi-cycle pulses with the theory predicting that the excitation efficiency increases with pulse duration decreasing into the few-cycle regime. Our work concentrates on experimentally investigating the effect of few-cycle pulses on the FTI excitation process. We use pulses with duration 6 fs centred at 800 nm at intensities up to 0.8 PW crossed with an atomic Ar beam. We find that with few-cycle pulses there is more FTI per tunneling event and that for the same pulse energy more FTI is generated.
Rights: © 2018 The Authors(s)
DOI: 10.1364/FIO.2018.JW3A.54
Published version: https://www-osapublishing-org.proxy.library.adelaide.edu.au/conference.cfm?meetingid=56&yr=2018
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