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|Title:||Frustrated tunnel ionization in the few-cycle regime|
|Citation:||Proceedings of the Frontiers in Optics: the 102nd OSA Annual Meeting and Exhibit/Laser Science Conference, 2018 / vol.JW3A.54, pp.1-2|
|Publisher:||The Optical Society|
|Series/Report no.:||OSA Technical Digest; JW3A.54|
|Conference Name:||Frontiers in Optics / Laser Science (16 Sep 2018 - 20 Sep 2018 : Washington, DC, United States)|
|R. D. Glover, D. Chetty, B. A. deHarak, A. J. Palmer, M. A. Dakka, J. L. Holdsworth, I. V. Litvinyuk, A. N. Luiten, P. S. Light, R. T. Sang|
|Abstract:||Frustrated tunnel ionization (FTI) is one of the dominant channels in strong field ionization that results in the excitation of atoms. Recent studies have shown that there is a significant number of FTI events for multi-cycle pulses with the theory predicting that the excitation efficiency increases with pulse duration decreasing into the few-cycle regime. Our work concentrates on experimentally investigating the effect of few-cycle pulses on the FTI excitation process. We use pulses with duration 6 fs centred at 800 nm at intensities up to 0.8 PW crossed with an atomic Ar beam. We find that with few-cycle pulses there is more FTI per tunneling event and that for the same pulse energy more FTI is generated.|
|Rights:||© 2018 The Authors(s)|
|Appears in Collections:||IPAS publications|
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