Please use this identifier to cite or link to this item: http://hdl.handle.net/2440/124487
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Type: Conference paper
Title: Metasurfaces for terahertz polarimetry
Author: Lee, W.
Fumeaux, C.
Withayachumnankul, W.
Citation: Proceedings of the 2018 IEEE 7th Asia-Pacific Conference on Antennas and Propagation (APCAP 2018), 2018 / pp.514-516
Publisher: IEEE
Publisher Place: Piscataway, NJ
Issue Date: 2018
Series/Report no.: IEEE Asia-Pacific Conference on Antennas and Propagation (APCAP)
ISBN: 1538656485
9781538656488
ISSN: 2381-5523
2642-9179
Conference Name: IEEE Asia-Pacific Conference on Antennas and Propagation (APCAP) (05 Aug 2018 - 08 Aug 2018 : Auckland, New Zealand)
Statement of
Responsibility: 
Wendy S. L. Lee, Christophe Fumeaux, and Withawat Withayachumnankul
Abstract: Polarimetry of electromagnetic waves is important for molecular spectroscopy and high-data rate wireless communications in the terahertz frequency regime. Conventional bulk optical systems used to achieve this functionality have several drawbacks including scarcity of available materials, narrow bandwidth and low efficiency. To overcome these limitations, we employ metasurfaces with spatially changing broadband birefringence to attain the same functionality. We present a metasurface designed with birefringent resonators that are rotated to decompose a normally incident wave into its circularly polarized orthogonal components, namely left-handed circularly polarized (LHCP) and right-handed circularly polarized (RHCP) waves. On that basis, polarimetric information on the incident wave can be retrieved, including circular, elliptical and linear polarization states. This functionality is preserved over a simulated bandwidth of up to 76% which corresponds to the frequency region of 0.65 THz to 1.45 THz.
Keywords: metasurface; terahertz; half-wave mirror; polarimetry
Rights: ©2018 IEEE
RMID: 0030106785
DOI: 10.1109/APCAP.2018.8538085
Grant ID: http://purl.org/au-research/grants/arc/DP170101922
Published version: https://ieeexplore.ieee.org/xpl/conhome/8509819/proceeding
Appears in Collections:Electrical and Electronic Engineering publications

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