Please use this identifier to cite or link to this item: http://hdl.handle.net/2440/12503
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Type: Journal article
Title: Noise reduction in terahertz thin film measurements using a double modulated differential technique
Author: Mickan, S.
Abbott, D.
Munch, J.
Zhang, X.
Citation: Fluctuation and Noise Letters, 2002; 2(1):R13-R28
Publisher: World Scientific Publishing Co. Pty. Ltd.
Issue Date: 2002
ISSN: 0219-4775
1793-6780
Statement of
Responsibility: 
Samuel P. Mickan, Derek Abbott, Jesper Munch and X.-C. Zhang
Abstract: Differential terahertz (THz) time-domain spectroscopy (TDS) is a technique for decreasing noise levels in THz thin film characterization experiments. Characterizing thin films in the GHz to THz range is critical for the development of fast integrated circuits and photonic systems, and is potentially applicable to biosensors and proteomics. This paper shows how the differential technique, combined with double modulation, enables the study of thin films with noise reduction over normal TDS that improves at the film gets thinner. Double modulated differential THz-TDS has enabled the characterization of films with less than 1-μm thickness.
Keywords: Terahertz; spectroscopy; double modulation; thin films
Description: © World Scientific Publishing Company
RMID: 0020022212
DOI: 10.1142/S0219477502000609
Appears in Collections:Physics publications
Environment Institute publications

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