Please use this identifier to cite or link to this item: https://hdl.handle.net/2440/126302
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Type: Conference paper
Title: Convergence properties of surface conductivity characterization method for thin conductive strips
Author: Shahpari, M.
Fumeaux, C.
Thiel, D.
Citation: Proceedings of the 4th Australian Microwave Symposium (AMS 2020), 2020, pp.1-2
Publisher: IEEE
Publisher Place: Piscataway, NJ
Issue Date: 2020
ISBN: 9781728110509
Conference Name: Australian Microwave Symposium (AMS) (13 Feb 2020 - 14 Feb 2020 : Sydney, Australia)
Statement of
Responsibility: 
Morteza Shahpari, Christophe Fumeaux and David V. Thiel
Abstract: A new method to measure the surface conductivity σs of thin conductors has been recently proposed, that requires placement of a narrow strip inside a rectangular waveguide. Infinite series appear in the calculations required to extract σ s from the measured scattering parameters. In this paper, we explore the convergence of the different series that are associated with two choices of basis functions (uniform & cosh). We also show the impact of the series truncation on the final computed values of the complex surface conductivity of 10- j 10mS=Sq at 10GHz.
Keywords: Surface conductivity; surface resistivity; measurement methods; convergent series; convergence error
Rights: © 2020 IEEE.
DOI: 10.1109/AMS48904.2020.9059362
Published version: https://ieeexplore.ieee.org/xpl/conhome/9046188/proceeding
Appears in Collections:Aurora harvest 8
Electrical and Electronic Engineering publications

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