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|Title:||Scaling in small-world resistor networks|
|Citation:||Physics Letters A, 2006; 350(5-6):324-330|
|Publisher:||Elsevier Science BV|
|Abstract:||We study the effective resistance of small-world resistor networks. Utilizing recent analytic results for the propagator of the Edwards–Wilkinson process on small-world networks, we obtain the asymptotic behavior of the disorder-averaged two-point resistance in the large system-size limit. We find that the small-world structure suppresses large network resistances: both the average resistance and its standard deviation approaches a finite value in the large system-size limit for any non-zero density of random links. We also consider a scenario where the link conductance decays as a power of the length of the random links, l−α. In this case we find that the average effective system resistance diverges for any non-zero value of α.|
|Keywords:||small-world model; resistor networks; scaling|
|Appears in Collections:||Electrical and Electronic Engineering publications|
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