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Type: Conference paper
Title: One dimensional wavelet transforms and their application to T-ray pulsed signal identification
Author: Yin, X.
Ng, B.
Ferguson, B.
Mickan, S.
Abbott, D.
Citation: Proceedings of SPIE, 2006 / Bell, J.M., Varadan, V.K. (ed./s), vol.6038, pp.603829-1-603829-11
Publisher: SPIE
Publisher Place:
Issue Date: 2006
Series/Report no.: Proceedings of SPIE--The International Society for Optical Engineering ; 6035-6039
ISBN: 0819460699
ISSN: 0277-786X
Conference Name: SPIE Microelectronics, MEMS, and Nanotechnology (11 Dec 2005 - 14 Dec 2005 : Brisbane, Australia)
Editor: Bell, J.M.
Varadan, V.K.
Statement of
Xiaoxia Yin, Brian W.-H. Ng, Bradley Ferguson, Samuel P. Mickan, and Derek Abbott
Abstract: This study investigates the application of one dimensional discrete wavelet transforms in the classification of T-ray pulsed signals. The Fast Fourier Transform (FFT) is used as a feature extraction tool and a Mahalanobis distance classifier is employed for classification. In this work, soft threshold wavelet shrinkage de-noising plays an important part in de-noising and reconstructing T-ray pulsed signals. In addition, Mallat's pyramid algorithm and a local modulus maxima method to reconstruct T-ray signals are investigated. Particularly the local modulus maxima method is analyzed and comparisons are made before and after reconstruction of signals. The results demonstrate that these two methods are especially effective in analyzing and reconstructing T-ray pulsed responses. Moreover, to test wavelet de-noising effectiveness, the accuracy of the classiffication is calculated and results are displayed in the form of scatter-plots. Results show that soft threshold wavelet shrinkage de-noising improves the classification accuracy and successfully generates visually pleasing scatter plots at selected three frequency components.
Description: ©2006 COPYRIGHT SPIE--The International Society for Optical Engineering.
DOI: 10.1117/12.673530
Appears in Collections:Aurora harvest 2
Electrical and Electronic Engineering publications

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