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Type: Journal article
Title: A complete operational amplifier noise model: analysis and measurement of correlation coefficient
Author: Xu, J.
Dai, Y.
Abbott, D.
Citation: IEEE Transactions on Circuits and Systems I - regular papers, 2000; 47(3):420-424
Publisher: IEEE-Inst Electrical Electronics Engineers Inc
Issue Date: 2000
ISSN: 1057-7122
Statement of
Jiansheng Xu, Yisong Dai, and Derek Abbott
Abstract: In contrast to the general operational amplifier (op amp) noise model widely used, we propose a more complete and applicable noise model, which considers the correlation between equivalent input voltage noise source en and current noise source in. Based on the super-position theorem and equivalent circuit noise theory, our formulae for the equivalent input noise spectrum density of an op amp noise are applied to both the inverting and noninverting input terminals. By measurement, we demonstrate that the new expressions are significantly more accurate. In addition, details of the measurement method for our noise model parameters are given. A commercial operational amplifier (Burr-Brown OPA37A) is measured by means of a low-frequency noise power spectrum measuring system and the measured results of its noise model parameters, including the spectral correlation coefficient (SCC), are finally given.
Description: Copyright © 2000 IEEE
RMID: 0001001419
DOI: 10.1109/81.841928
Appears in Collections:Electrical and Electronic Engineering publications

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