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Type: Journal article
Title: The study on a screening threshold for reliability estimation of optoelectronic coupled devices
Author: Xu, J.
Abbott, D.
Dai, Y.
Citation: Microelectronics Journal, 2000; 31(7):497-501
Publisher: Elsevier Sci Ltd
Issue Date: 2000
ISSN: 0026-2692
Keywords: Optoelectronic coupled devices; Excess noise; Device reliability and screening
Rights: ©2000 Elsevier Science Ltd. All rights reserved.
RMID: 0001001418
DOI: 10.1016/S0026-2692(00)00022-7
Appears in Collections:Electrical and Electronic Engineering publications

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