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Type: Journal article
Title: 1/f, g-r and burst noise used as a screening threshold for reliability estimation of optoelectronic coupled devices
Author: Xu, J.
Abbott, D.
Dai, Y.
Citation: Microelectronics Reliability, 2000; 40(1):171-178
Publisher: Pergamon-Elsevier Science Ltd
Issue Date: 2000
ISSN: 0026-2714
Abstract: In this paper the theoretical analysis of noise sources in Optoelectronic Coupled Devices (OCDs) is given and the relation between typical defects and 1/f, g–r and burst noise is described. According to statistical and experimental results, a threshold to screen potential devices with excess noise is derived, which has been proved theoretically that the screening criterion is reasonable. Moreover, the experimental results show that the method is of practical value.
DOI: 10.1016/S0026-2714(99)00221-8
Appears in Collections:Aurora harvest 2
Electrical and Electronic Engineering publications

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