Please use this identifier to cite or link to this item:
Scopus Web of ScienceĀ® Altmetric
Full metadata record
DC FieldValueLanguage
dc.contributor.authorFerguson, B.en
dc.contributor.authorWang, S.en
dc.contributor.authorGray, D.en
dc.contributor.authorAbbott, D.en
dc.contributor.authorZhang, X.en
dc.identifier.citationTechnical digest : summaries of papers presented at the Quantum Electronics and Laser Science Conference : Long Beach Convention Center, Long Beach, California, May 19-24, 2002 / pp. 44-45.en
dc.description.abstractT-ray computed tomography imaging has significant potential in a number of applications. It is capable of reconstructing the 3D structure and frequency dependent far-infrared optical properties of an object. Using the reconstructed material properties different substances may be uniquely identified despite being hidden within other opaque structures. Applications of this technology are foreseen in non-destructive mail/packaging inspection, semiconductor testing, quality control of plastics and certain biomedical applications where the absorption of THz is not prohibitive.en
dc.description.statementofresponsibilityBradley Ferguson, Shaohong Wang, Doug Gray, Derek Abbott and X.-C. Zhangen
dc.publisherOptical Society of Americaen
dc.relation.ispartofseriesOSA trends in optics and photonics ; 74.en
dc.rightsCopyright 2002, Optical Society of Americaen
dc.titleThree dimensional imaging using T-ray computed tomographyen
dc.typeConference paperen
dc.contributor.conferenceQuantum Electronics and Laser Science Conference (2002 : Long Beach, Calif.)en
pubs.library.collectionElectrical and Electronic Engineering publicationsen
dc.identifier.orcidAbbott, D. [0000-0002-0945-2674]en
Appears in Collections:Electrical and Electronic Engineering publications

Files in This Item:
There are no files associated with this item.

Items in DSpace are protected by copyright, with all rights reserved, unless otherwise indicated.