Please use this identifier to cite or link to this item: https://hdl.handle.net/2440/44971
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Type: Conference paper
Title: Transmission characteristics of T-ray multilayer interference filters
Author: Withayachumnankul, W.
Fischer, B.
Mickan, S.
Abbott, D.
Citation: Photonics: Design, Technology, and Packaging III / Wieslaw Z. Krolikowski, Costas M. Soukoulis, Ping Koy Lam, Timothy J. Davis, Shanhui Fan, Yuri S. Kivshar(eds.):www1-www15
Publisher: SPIE
Publisher Place: CDROM
Issue Date: 2008
Series/Report no.: Proceedings of SPIE ; 6801
ISBN: 9780819469724
ISSN: 0277-786X
1996-756X
Conference Name: Photonics: Design, Technology, and Packaging III (2007 : Canberra, Australia)
Editor: Krolikowski, W.
Soukoulis, C.
Lam, P.
Davis, T.
Fan, S.
Kivshar, Y.
Abstract: An optical multilayer interference filter is made from two or more different dielectric materials layered in such a way that it promotes constructive or destructive wave interference for a selected frequency in the direction normal to the layers. Usually, each layer has the thickness of a quarter of wavelength at which the stop-band is required. In this paper, a quarter-wavelength multilayer interference filter is realised for T-ray applications. The dielectric materials used are high-resistivity silicon and free space, both of which have high transparency to T-rays and flat all-pass responses over the frequencies of interest. The designed thickness of both materials is in the order of a hundred microns, and thus allows the novelty of a retrofittable assembled structure. An analysis of the affect of the number of layers on the spectral response is given for the first time. The THz-TDS measurement of the fabricated structure is demonstrated to be in agreement with theory.
Description: Copyright © 2008 SPIE - The International Society for Optical Engineering.
DOI: 10.1117/12.758811
Appears in Collections:Aurora harvest 6
Electrical and Electronic Engineering publications

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