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|Title:||Transmission characteristics of T-ray multilayer interference filters|
|Citation:||Photonics: Design, Technology, and Packaging III / Wieslaw Z. Krolikowski, Costas M. Soukoulis, Ping Koy Lam, Timothy J. Davis, Shanhui Fan, Yuri S. Kivshar(eds.):www1-www15|
|Series/Report no.:||Proceedings of SPIE ; 6801|
|Conference Name:||Photonics: Design, Technology, and Packaging III (2007 : Canberra, Australia)|
|Abstract:||An optical multilayer interference filter is made from two or more different dielectric materials layered in such a way that it promotes constructive or destructive wave interference for a selected frequency in the direction normal to the layers. Usually, each layer has the thickness of a quarter of wavelength at which the stop-band is required. In this paper, a quarter-wavelength multilayer interference filter is realised for T-ray applications. The dielectric materials used are high-resistivity silicon and free space, both of which have high transparency to T-rays and flat all-pass responses over the frequencies of interest. The designed thickness of both materials is in the order of a hundred microns, and thus allows the novelty of a retrofittable assembled structure. An analysis of the affect of the number of layers on the spectral response is given for the first time. The THz-TDS measurement of the fabricated structure is demonstrated to be in agreement with theory.|
|Description:||Copyright © 2008 SPIE - The International Society for Optical Engineering.|
|Appears in Collections:||Aurora harvest 6|
Electrical and Electronic Engineering publications
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