Please use this identifier to cite or link to this item: https://hdl.handle.net/2440/47233
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Type: Conference paper
Title: Analysis of measurement uncertainty in THz-TDS
Author: Withayachumnankul, W.
Lin, H.
Mickan, S.
Fischer, B.
Abbott, D.
Citation: Photonic Materials Devices and Applications II, Vol 6593, pp.659326-1-659326-18
Publisher: The International Society for Optical Engineering
Publisher Place: USA
Issue Date: 2007
Series/Report no.: Proceedings of SPIE ; 6593
ISBN: 0819467219
9780819467218
ISSN: 0277-786X
1996-756X
Conference Name: Photonic Materials, Devices, and Applications II (2007 : Maspalomas, Gran Canaria)
Editor: N/A
Statement of
Responsibility: 
W. Withayachumnankul, H. Lin, S. P. Mickan, B. M. Fischer, and D. Abbott
Abstract: Measurement precision is often required in the process of material parameter extraction. This fact is applicable to terahertz time-domain spectroscopy (THz-TDS), which is able to determine the optical/dielectric constants of material in the T-ray regime. Essentially, an ultrafast-pulsed THz-TDS system is composed of several mechanical, optical, and electronic parts, each of which is limited in precision. In operation, the uncertainties of these parts, along with the uncertainties introduced during the parameter extraction process, contribute to the overall uncertainty appearing at the output, i.e. the uncertainty in the extracted optical constants. This paper analyzes the sources of uncertainty and models error propagation through the process.
Description: Copyright 2007 Society of Photo-Optical Instrumentation Engineers. This paper was published in Photonic Materials, Devices, and Applications II, edited by Ali Serpengüzel, Gonçal Badenes, Giancarlo Righini Proc. of SPIE Vol. 6593, 659326 and is made available as an electronic reprint with permission of SPIE. One print or electronic copy may be made for personal use only. Systematic or multiple reproduction, distribution to multiple locations via electronic or other means, duplication of any material in this paper for a fee or for commercial purposes, or modification of the content of the paper are prohibited.
DOI: 10.1117/12.721876
Appears in Collections:Aurora harvest
Electrical and Electronic Engineering publications

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