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Type: Conference paper
Title: Analysis of measurement uncertainty in THz-TDS
Author: Withayachumnankul, W.
Lin, H.
Mickan, S.
Fischer, B.
Abbott, D.
Citation: Photonic Materials Devices and Applications II, Vol 6593, pp.659326-1-659326-18
Publisher: The International Society for Optical Engineering
Publisher Place: USA
Issue Date: 2007
Series/Report no.: Proceedings of SPIE ; 6593
ISBN: 0819467219
ISSN: 0277-786X
Conference Name: Photonic Materials, Devices, and Applications II (2007 : Maspalomas, Gran Canaria)
Statement of
W. Withayachumnankul, H. Lin, S. P. Mickan, B. M. Fischer, and D. Abbott
Description: Copyright 2007 Society of Photo-Optical Instrumentation Engineers. This paper was published in Photonic Materials, Devices, and Applications II, edited by Ali Serpengüzel, Gonçal Badenes, Giancarlo Righini Proc. of SPIE Vol. 6593, 659326 and is made available as an electronic reprint with permission of SPIE. One print or electronic copy may be made for personal use only. Systematic or multiple reproduction, distribution to multiple locations via electronic or other means, duplication of any material in this paper for a fee or for commercial purposes, or modification of the content of the paper are prohibited.
RMID: 0020074444
DOI: 10.1117/12.721876
Appears in Collections:Electrical and Electronic Engineering publications

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