Please use this identifier to cite or link to this item:
https://hdl.handle.net/2440/47233
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DC Field | Value | Language |
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dc.contributor.author | Withayachumnankul, W. | - |
dc.contributor.author | Lin, H. | - |
dc.contributor.author | Mickan, S. | - |
dc.contributor.author | Fischer, B. | - |
dc.contributor.author | Abbott, D. | - |
dc.contributor.editor | N/A, | - |
dc.date.issued | 2007 | - |
dc.identifier.citation | Photonic Materials Devices and Applications II, Vol 6593, pp.659326-1-659326-18 | - |
dc.identifier.isbn | 0819467219 | - |
dc.identifier.isbn | 9780819467218 | - |
dc.identifier.issn | 0277-786X | - |
dc.identifier.issn | 1996-756X | - |
dc.identifier.uri | http://hdl.handle.net/2440/47233 | - |
dc.description | Copyright 2007 Society of Photo-Optical Instrumentation Engineers. This paper was published in Photonic Materials, Devices, and Applications II, edited by Ali Serpengüzel, Gonçal Badenes, Giancarlo Righini Proc. of SPIE Vol. 6593, 659326 and is made available as an electronic reprint with permission of SPIE. One print or electronic copy may be made for personal use only. Systematic or multiple reproduction, distribution to multiple locations via electronic or other means, duplication of any material in this paper for a fee or for commercial purposes, or modification of the content of the paper are prohibited. | - |
dc.description.abstract | Measurement precision is often required in the process of material parameter extraction. This fact is applicable to terahertz time-domain spectroscopy (THz-TDS), which is able to determine the optical/dielectric constants of material in the T-ray regime. Essentially, an ultrafast-pulsed THz-TDS system is composed of several mechanical, optical, and electronic parts, each of which is limited in precision. In operation, the uncertainties of these parts, along with the uncertainties introduced during the parameter extraction process, contribute to the overall uncertainty appearing at the output, i.e. the uncertainty in the extracted optical constants. This paper analyzes the sources of uncertainty and models error propagation through the process. | - |
dc.description.statementofresponsibility | W. Withayachumnankul, H. Lin, S. P. Mickan, B. M. Fischer, and D. Abbott | - |
dc.language.iso | en | - |
dc.publisher | The International Society for Optical Engineering | - |
dc.relation.ispartofseries | Proceedings of SPIE ; 6593 | - |
dc.source.uri | http://dx.doi.org/10.1117/12.721876 | - |
dc.title | Analysis of measurement uncertainty in THz-TDS | - |
dc.type | Conference paper | - |
dc.contributor.conference | Photonic Materials, Devices, and Applications II (2007 : Maspalomas, Gran Canaria) | - |
dc.identifier.doi | 10.1117/12.721876 | - |
dc.publisher.place | USA | - |
pubs.publication-status | Published | - |
dc.identifier.orcid | Withayachumnankul, W. [0000-0003-1155-567X] | - |
dc.identifier.orcid | Abbott, D. [0000-0002-0945-2674] | - |
Appears in Collections: | Aurora harvest Electrical and Electronic Engineering publications |
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hdl_47233.pdf | 907.6 kB | Publisher's PDF | View/Open |
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