Please use this identifier to cite or link to this item: http://hdl.handle.net/2440/55058
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Type: Conference paper
Title: Measurement of linearity in THz-TDS
Author: Withayachumnankul, W.
Ung, B.
Fischer, B.
Abbott, D.
Citation: Proceeding of the 34th International Conference on Infrared, Millimeter, and Terahertz Wave, 2009: pp.1-2
Publisher: IEEE
Publisher Place: CD
Issue Date: 2009
ISBN: 9781424454174
Conference Name: IRMMW - THz 2009 (34th : 2009 : Korea)
Statement of
Responsibility: 
Withayachumnankul, W.; Ung, B.S.-Y.; Fischer, B.M. and Abbott, D.;
Abstract: This article presents an approach to the measurement of the amplitude linearity in terahertz time-domain spectroscopy (THz-TDS) systems. The approach exploits a single wafer of high-purity float-zone silicon to produce multiple Fabry-Perot reflections, which are stepwise attenuated and delayed. Comparison between the theoretical and experimental results can indicate a deviation in linearity.
RMID: 0020093260
DOI: 10.1109/ICIMW.2009.5324721
Appears in Collections:Electrical and Electronic Engineering publications

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