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dc.contributor.authorWithayachumnankul, W.en
dc.contributor.authorUng, B.en
dc.contributor.authorFischer, B.en
dc.contributor.authorAbbott, D.en
dc.identifier.citationProceeding of the 34th International Conference on Infrared, Millimeter, and Terahertz Wave, 2009: pp.1-2en
dc.description.abstractThis article presents an approach to the measurement of the amplitude linearity in terahertz time-domain spectroscopy (THz-TDS) systems. The approach exploits a single wafer of high-purity float-zone silicon to produce multiple Fabry-Perot reflections, which are stepwise attenuated and delayed. Comparison between the theoretical and experimental results can indicate a deviation in linearity.en
dc.description.statementofresponsibilityWithayachumnankul, W.; Ung, B.S.-Y.; Fischer, B.M. and Abbott, D.;en
dc.titleMeasurement of linearity in THz-TDSen
dc.typeConference paperen
dc.contributor.conferenceIRMMW - THz 2009 (34th : 2009 : Korea)en
dc.identifier.orcidWithayachumnankul, W. [0000-0003-1155-567X]en
dc.identifier.orcidAbbott, D. [0000-0002-0945-2674]en
Appears in Collections:Electrical and Electronic Engineering publications

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