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Please use this identifier to cite or link to this item: https://hdl.handle.net/2440/55058
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dc.contributor.authorWithayachumnankul, W.-
dc.contributor.authorUng, B.-
dc.contributor.authorFischer, B.-
dc.contributor.authorAbbott, D.-
dc.date.issued2009-
dc.identifier.citationProceeding of the 34th International Conference on Infrared, Millimeter, and Terahertz Wave, 2009: pp.1-2-
dc.identifier.isbn9781424454174-
dc.identifier.urihttp://hdl.handle.net/2440/55058-
dc.description.abstractThis article presents an approach to the measurement of the amplitude linearity in terahertz time-domain spectroscopy (THz-TDS) systems. The approach exploits a single wafer of high-purity float-zone silicon to produce multiple Fabry-Perot reflections, which are stepwise attenuated and delayed. Comparison between the theoretical and experimental results can indicate a deviation in linearity.-
dc.description.statementofresponsibilityWithayachumnankul, W.; Ung, B.S.-Y.; Fischer, B.M. and Abbott, D.;-
dc.language.isoen-
dc.publisherIEEE-
dc.source.urihttp://dx.doi.org/10.1109/icimw.2009.5324721-
dc.titleMeasurement of linearity in THz-TDS-
dc.typeConference paper-
dc.contributor.conferenceIRMMW - THz 2009 (34th : 2009 : Korea)-
dc.identifier.doi10.1109/ICIMW.2009.5324721-
dc.publisher.placeCD-
pubs.publication-statusPublished-
dc.identifier.orcidWithayachumnankul, W. [0000-0003-1155-567X]-
dc.identifier.orcidAbbott, D. [0000-0002-0945-2674]-
Appears in Collections:Aurora harvest
Electrical and Electronic Engineering publications

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