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Type: Journal article
Title: Application of atomic force microscopy as a nanotechnology tool in food science.
Author: Yang, H.
Wang, Y.
Lai, S.
An, H.
Li, Y.
Chen, F.
Citation: Journal of Food Science, 2007; 72(4):R65-R75
Publisher: Inst Food Technologists
Issue Date: 2007
ISSN: 0022-1147
Statement of
Hongshun Yang, Yifen Wang, Shaojuan Lai, Hongjie An, Yunfei Li and Fusheng Chen
Abstract: Atomic force microscopy (AFM) provides a method for detecting nanoscale structural information. First, this review explains the fundamentals of AFM, including principle, manipulation, and analysis. Applications of AFM are then reported in food science and technology research, including qualitative macromolecule and polymer imaging, complicated or quantitative structure analysis, molecular interaction, molecular manipulation, surface topography, and nanofood characterization. The results suggested that AFM could bring insightful knowledge on food properties, and the AFM analysis could be used to illustrate some mechanisms of property changes during processing and storage. However, the current difficulty in applying AFM to food research is lacking appropriate methodology for different food systems. Better understanding of AFM technology and developing corresponding methodology for complicated food systems would lead to a more in-depth understanding of food properties at macromolecular levels and enlarge their applications. The AFM results could greatly improve the food processing and storage technologies.
DOI: 10.1111/j.1750-3841.2007.00346.x
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Appears in Collections:Aurora harvest
Earth and Environmental Sciences publications

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