Please use this identifier to cite or link to this item: https://hdl.handle.net/2440/56322
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Type: Conference paper
Title: Generalized-scattering-matrix extraction using the Finite-Volume Time-Domain (FVTD) method
Author: Baumann, D.
Fumeaux, C.
Leuchtmann, P.
Vahldieck, R.
Citation: IEEE MTT-S International Microwave Symposium, 2004: pp.1701-1704
Publisher: IEEE
Publisher Place: Online
Issue Date: 2004
ISBN: 0780383311
ISSN: 0149-645X
Conference Name: IEEE MTT-S International Microwave Symposium (2004 : Fort Worth, Texas)
Statement of
Responsibility: 
Dirk Baumann, Christophe Fumeaux, Pascal Leuchtmann, Rudiger Vahldieck
Abstract: In this paper the extraction of the generalized scattering matrix using the finite-volume time-domain (FVTD) method is presented. The extraction scheme takes advantage of the flux-splitting formulation that is inherent to the FVTD algorithm. Thus the incident and reflected waves in a transmission line are immediately known at every time step. A new way to determine the power waves is shown as well as the implementation of the ports and the mode separation in a multimode environment. The ability of the proposed scheme to extract the scattering parameters correctly is illustrated in an example that compares the simulated return loss of a balun to measurements.
Keywords: FVTD
scattering parameters.
Description: ©2004 IEEE. Personal use of this material is permitted. However, permission to reprint/republish this material for advertising or promotional purposes or for creating new collective works for resale or redistribution to servers or lists, or to reuse any copyrighted component of this work in other works must be obtained from the IEEE. This material is presented to ensure timely dissemination of scholarly and technical work. Copyright and all rights therein are retained by authors or by other copyright holders. All persons copying this information are expected to adhere to the terms and constraints invoked by each author's copyright. In most cases, these works may not be reposted without the explicit permission of the copyright holder.
DOI: 10.1109/MWSYM.2004.1338919
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Electrical and Electronic Engineering publications

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