Please use this identifier to cite or link to this item: http://hdl.handle.net/2440/62166
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Type: Conference paper
Title: Mitigating scattering effects in THz-TDS measurements
Author: Kaushik, M.
Ng, B.
Fischer, B.
Abbott, D.
Citation: Proceedings of the 35th International Conference on Infrared, Millimeter, and Terahertz Waves,(IRMMW-THz 2010), held in Rome Italy 5-10 September 2010: pp.1-2
Publisher: IEEE
Publisher Place: USA
Issue Date: 2010
ISBN: 9781424466566
Conference Name: IRMMW-THz 2010 (35th : 2010 : Rome, Italy)
Statement of
Responsibility: 
Mayank Kaushik, Brian W.-H. Ng, Bernd M. Fischer, and Derek Abbott
Abstract: Scattering is a major problem in precise measurement of quasi-optical parameters of material samples. In this paper, we review some popular scattering mitigating techniques and propose a novel method that allows calculating true absorption spectra for samples with unknown thickness and granularity.
Rights: Copyright 2010 IEEE
RMID: 0020101459
DOI: 10.1109/ICIMW.2010.5612470
Appears in Collections:Electrical and Electronic Engineering publications

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