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|Title:||Dispersion-insensitive measurement of thickness and group refractive index by low-coherence interferometry|
|Author:||Murphy, Dominic F.|
Flavin, Donal A.
|Citation:||Applied Optics, 2000; 39(25):4607-4615|
|School/Discipline:||School of Chemistry and Physics|
|Dominic F. Murphy and Dónal A. Flavin|
|Rights:||© 2000 Optical Society of America|
|Appears in Collections:||IPAS publications|
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