Please use this identifier to cite or link to this item: http://hdl.handle.net/2440/66570
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Type: Journal article
Title: Comprehensive modeling of THz microscope with a sub-wavelength source
Author: Lin, H.
Fumeaux, C.
Ung, B.
Abbott, D.
Citation: Optics Express, 2011; 19(6):5327-5338
Publisher: Optical Soc Amer
Issue Date: 2011
ISSN: 1094-4087
1094-4087
Statement of
Responsibility: 
Hungyen Lin, Christophe Fumeaux, Benjamin Seam Yu Ung, and Derek Abbott
Abstract: The sub-wavelength THz emission point on a nonlinear electrooptical crystal, used in broadband THz near-field emission microscopy, is computationally modeled as a radiating aperture of Gaussian intensity profile. This paper comprehensively studies the Gaussian aperture model in the THz near-field regime and validates the findings with dual-axis knife-edge experiments. Based on realistic parameter values, the model allows for THz beam characterisation in the near-field region for potential microscopy applications. An application example is demonstrated by scanning over a cyclic-olefin copolymer sample containing grooves placed sub-wavelengths apart. The nature of THz microscopy in the near-field is highly complex and traditionally based on experiments. The proposed validated numerical model therefore aids in the quantitative understanding of the performance parameters. Whilst in this paper we demonstrate the model on broadband electro-optical THz near-field emission microscopy, the model may apply without a loss of generality to other types of THz near-field focused beam techniques.
Rights: © 2011 Optical Society of America
RMID: 0020105666
DOI: 10.1364/OE.19.005327
Appears in Collections:Electrical and Electronic Engineering publications

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