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Type: Journal article
Title: Comparison of micrometer- and scanning electron microscope-based measurements of avian eggshell thickness
Author: Igic, B.
Hauber, M.
Galbraith, J.
Grim, T.
Dearborn, D.
Brennan, P.
Moskat, C.
Choudhary, P.
Cassey, P.
Citation: Journal of Field Ornithology, 2010; 81(4):402-410
Publisher: Assoc Field Ornithologists
Issue Date: 2010
ISSN: 0273-8570
Statement of
Branislav Igic, Mark E. Hauber, Josie A. Galbraith, Tomas Grim, Donald C. Dearborn, Patricia L. R. Brennan, Csaba Moskát, Pankaj K. Choudhary and Phillip Cassey
Abstract: The study of avian eggshell structure, including composition, pigmentation, thickness, and strength, has important ecological and economic implications. Previous investigators have used a variety of techniques to derive either direct measures or indirect estimates of eggshell thickness. Assessing the repeatability and method agreement of different techniques is necessary to permit comparison of eggshell thickness values from different studies on various genetic stocks, populations, and species. We recorded and analyzed measurements of eggshell thickness using two methods, micrometers and scanning electron microscopy (SEM), for several Palaeognathae and Neognathae taxa, including nonpasserines and passerines. Applying a tolerance-interval approach, we found that repeatability of measurements for eggs with thinner shells (<300 μm, all Neognathae taxa) was worse than for eggs with thicker shells (Palaeognathae taxa), but was still statistically and biologically reasonable given that the relative magnitude of intramethod agreements was <11%. Our results support previous predictions that measurements made using a micrometer are comparable to those made using SEM. This finding is particularly important given the relative ease and cost efficiency of the micrometer method. Importantly, these new analyses can be used to validate the use of published data from previous studies of micrometer-based eggshell thickness for both intra- and interspecific comparisons.
Keywords: avian eggshell; electron microscope; thickness measurement; tolerance interval
Rights: Copyright 2010 The Authors. Journal of Field Ornithology. Copyright 2010 Association of Field Ornithologists
RMID: 0020112276
DOI: 10.1111/j.1557-9263.2010.00296.x
Appears in Collections:Earth and Environmental Sciences publications
Environment Institute Leaders publications

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