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Type: Journal article
Title: A review on thin-film sensing with terahertz waves
Author: O'Hara, J.
Withayachumnankul, W.
Al-Naib, I.
Citation: Journal of Infrared, Millimeter and Terahertz Waves, 2012; 33(3):245-291
Publisher: Springer
Issue Date: 2012
ISSN: 1866-6892
Abstract: In the past two decades, the development and steady improvement of terahertz technology has motivated a wide range of scientific studies designed to discover and develop terahertz applications. Terahertz sensing is one such application, and its continued maturation is virtually guaranteed by the unique properties that materials exhibit in the terahertz frequency range. Thinfilm sensing is one branch of this effort that has enjoyed diverse development in the last decade. Deeply subwavelength sample thicknesses impose great difficulties to conventional terahertz spectroscopy, yet sensing those samples is essential for a large number of applications. In this article we review terahertz thin-film sensing, summarizing the motivation, challenges, and state-of-the-art approaches based predominately on terahertz time-domain spectroscopy.
Keywords: Terahertz
time-domain spectroscopy
terahertz interferometry
terahertz differential time-domain spectroscopy
terahertz goniometry
terahertz ellipsometry
parallel plate waveguide
microstrip transmission line
frequency selective surface
surface wave
Zenneck wave
surface plasmon polariton
hole array
quality factorSensitivity • Quality factor
Rights: © Springer Science+Business Media, LLC 2012
DOI: 10.1007/s10762-012-9878-x
Appears in Collections:Aurora harvest
Electrical and Electronic Engineering publications

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