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Type: Conference paper
Title: Guaranteed ellipse fitting with the Sampson distance
Author: Szpak, Z.
Chojnacki, W.
Van Den Hengel, A.
Citation: Proceedings of the 12th European Conference on Computer Vision, held in Florence, Italy, 7-13 October, 2012 / A. Fitzgibbon, S. Lazebnik, P. Perona, Y. Sato and C. Schmid (eds.): pp.87-100
Publisher: Springer-Verlag
Publisher Place: Germany
Issue Date: 2012
Series/Report no.: Lecture Notes in Computer Science; 7576
ISBN: 9783642337642
ISSN: 0302-9743
Conference Name: European Conference on Computer Vision (12th : 2012 : Florence, Italy)
Statement of
Zygmunt L. Szpak, Wojciech Chojnacki and Anton van den Hengel
Abstract: When faced with an ellipse fitting problem, practitioners frequently resort to algebraic ellipse fitting methods due to their simplicity and efficiency. Currently, practitioners must choose between algebraic methods that guarantee an ellipse fit but exhibit high bias, and geometric methods that are less biased but may no longer guarantee an ellipse solution. We address this limitation by proposing a method that strikes a balance between these two objectives. Specifically, we propose a fast stable algorithm for fitting a guaranteed ellipse to data using the Sampson distance as a data-parameter discrepancy measure. We validate the stability, accuracy, and efficiency of our method on both real and synthetic data. Experimental results show that our algorithm is a fast and accurate approximation of the computationally more expensive orthogonal-distance-based ellipse fitting method. In view of these qualities, our method may be of interest to practitioners who require accurate and guaranteed ellipse estimates.
Rights: © Springer-Verlag Berlin Heidelberg 2012
RMID: 0020122960
DOI: 10.1007/978-3-642-33715-4_7
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Appears in Collections:Computer Science publications

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