Please use this identifier to cite or link to this item: http://hdl.handle.net/2440/81575
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Type: Conference paper
Title: Heart rate complexity and cardiac sympathetic dysinnervation in patients with type 2 diabetes mellitus
Author: Baumert, M.
Sacre, J.
Citation: Proceedings of the 35th Annual International Conference of the IEEE EMBS, 2013: pp.5570-5573
Publisher: IEEE
Publisher Place: USA
Issue Date: 2013
Series/Report no.: IEEE Engineering in Medicine and Biology Society Conference Proceedings
ISBN: 9781457702167
ISSN: 1557-170X
1558-4615
Conference Name: Annual International Conference of the IEEE Engineering in Medicine and Biology Society (35th : 2013 : Osaka, Japan)
Statement of
Responsibility: 
Mathias Baumert, Julian W Sacre
Abstract: Cardiovascular autonomic neuropathy (CAN) is one of the most severe complications of type 2 diabetes mellitus (T2DM). The aim of this study was to investigate associations of cardiac sympathetic dysinnervation (CSD; by ¹²³I-MIBG scintigraphy) with short-term heart rate variability (HRV) measured by traditional vs. complexity markers. ECG was measured in 31 diabetic patients during rest over a period of 5 minutes and HRV quantified in different domains (time and frequency domain, scaling properties, symbolic dynamics). ¹²³I-MIBG scintigraphy identified 16 patients with CSD. Resting heart rate was increased and HRV reduced in these patients. In a subgroup of 16 patients ECG was also measured during standing. Changes in several HRV measures upon standing demonstrated cardiac responsiveness to orthostatic stress. Strong correlations between HRV, measured during standing, and CSD were observed with metrics based on symbolic dynamics. In conclusion, HRV assessment during standing may be useful for assessing cardiac sympathetic dysinnervation in patients with type 2 diabetes mellitus.
Keywords: Heart; Sympathetic Nervous System; Humans; Diabetic Neuropathies; Diabetes Mellitus, Type 2; 3-Iodobenzylguanidine; Radionuclide Imaging; Heart Rate; Supine Position
Rights: Copyright © 2013 by IEEE
RMID: 0020130484
DOI: 10.1109/EMBC.2013.6610812
Appears in Collections:Electrical and Electronic Engineering publications

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