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Type: Journal article
Title: Simplified three-cornered-hat technique for frequency stability measurements
Author: Gunn, L.
Catlow, P.
Al-Ashwal, W.
Hartnett, J.
Allison, A.
Abbott, D.
Citation: IEEE Transactions on Instrumentation and Measurement, 2014; 63(4):889-895
Publisher: IEEE-Inst Electrical Electronics Engineers Inc
Issue Date: 2014
ISSN: 0018-9456
Organisation: Institute for Photonics & Advanced Sensing (IPAS)
Statement of
Lachlan J. Gunn, Peter G. Catlow, Waddah A. Al-Ashwal, John G. Hartnett, Andrew Allison, and Derek Abbott.
Abstract: We propose a novel technique allowing the use of the three-cornered-hat method with two devices under test (DUTs) and a time-tagging system that employs a common reference oscillator. The precision of a time-tagging system is reduced by fluctuations in the timebase, which are canceled when the relative phase between the two DUTs is measured. However, the raw time-tags in this system provide a phase comparison between the DUTs and the system timebase, allowing the use of the three-cornered hat with some dual-channel measurement instruments.
Keywords: Frequency stability; noise measurement; phase noise; test equipment; three-cornered-hat method.
Rights: ©2013 IEEE. Personal use is permitted, but republication/redistribution requires IEEE permission.
RMID: 0020136540
DOI: 10.1109/TIM.2013.2285796
Appears in Collections:IPAS publications

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