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|Title:||Simplified three-cornered-hat technique for frequency stability measurements|
|Citation:||IEEE Transactions on Instrumentation and Measurement, 2014; 63(4):889-895|
|Publisher:||IEEE-Inst Electrical Electronics Engineers Inc|
|Organisation:||Institute for Photonics & Advanced Sensing (IPAS)|
|Lachlan J. Gunn, Peter G. Catlow, Waddah A. Al-Ashwal, John G. Hartnett, Andrew Allison, and Derek Abbott.|
|Abstract:||We propose a novel technique allowing the use of the three-cornered-hat method with two devices under test (DUTs) and a time-tagging system that employs a common reference oscillator. The precision of a time-tagging system is reduced by fluctuations in the timebase, which are canceled when the relative phase between the two DUTs is measured. However, the raw time-tags in this system provide a phase comparison between the DUTs and the system timebase, allowing the use of the three-cornered hat with some dual-channel measurement instruments.|
|Keywords:||Frequency stability; noise measurement; phase noise; test equipment; three-cornered-hat method.|
|Rights:||©2013 IEEE. Personal use is permitted, but republication/redistribution requires IEEE permission.|
|Appears in Collections:||IPAS publications|
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