Please use this identifier to cite or link to this item: http://hdl.handle.net/2440/85230
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Type: Conference paper
Title: Analysis of system trade-offs for terahertz imaging
Author: Mickan, S.
Abbott, D.
Munch, J.
Zhang, X.C.
van Doorn, T.
Citation: Electronics and Structures for MEMS, 1999 / Bergmann, N.W., Reinhold, O., Tien, N.C. (ed./s), vol.3891, pp.226-237
Publisher: SPIE
Issue Date: 1999
Series/Report no.: Proceedings of the Society of Photo-optical InstrumentationEengineers (SPIE)
ISBN: 0819434922
ISSN: 0277-786X
Conference Name: SPIE Conference on Electronics and Structures for MEMS (27 Oct 1999 - 29 Oct 1999 : Gold Coast, Queensland)
Statement of
Responsibility: 
Samuel P. Mickan, Derek Abbott, Jesper Munch, Xi-Cheng Zhang, Timothy van Doorn
Keywords: terahertz; T-ray imaging; optoelectronics; wavelets
Rights: © (1999) COPYRIGHT SPIE
RMID: 0030007145
DOI: 10.1117/12.364444
Appears in Collections:Electrical and Electronic Engineering publications

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