Please use this identifier to cite or link to this item:
http://hdl.handle.net/2440/87005
Citations | ||
Scopus | Web of Science® | Altmetric |
---|---|---|
?
|
?
|
Full metadata record
DC Field | Value | Language |
---|---|---|
dc.contributor.author | Liu, H.H.T. | en |
dc.contributor.author | Shi, P. | en |
dc.contributor.author | Jiang, B. | en |
dc.date.issued | 2013 | en |
dc.identifier.citation | Journal of the Franklin Institute, 2013; 350(9):2371-2372 | en |
dc.identifier.issn | 0016-0032 | en |
dc.identifier.uri | http://hdl.handle.net/2440/87005 | - |
dc.description.statementofresponsibility | Hugh H.T. Liu, Peng Shi, Bin Jiang | en |
dc.language.iso | en | en |
dc.publisher | Elsevier | en |
dc.rights | © 2013 The Franklin Institute | en |
dc.title | Fault detection, diagnosis, and fault tolerant control with flight applications | en |
dc.type | Journal article | en |
dc.identifier.rmid | 0030007000 | en |
dc.identifier.doi | 10.1016/j.jfranklin.2013.07.001 | en |
dc.identifier.pubid | 71661 | - |
pubs.library.collection | Electrical and Electronic Engineering publications | en |
pubs.library.team | DS07 | en |
pubs.verification-status | Verified | en |
pubs.publication-status | Published | en |
dc.identifier.orcid | Shi, P. [0000-0001-8218-586X] | en |
Appears in Collections: | Electrical and Electronic Engineering publications |
Files in This Item:
There are no files associated with this item.
Items in DSpace are protected by copyright, with all rights reserved, unless otherwise indicated.