Please use this identifier to cite or link to this item: https://hdl.handle.net/2440/87760
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Type: Conference paper
Title: Frequency stability and phase noise of an improved X-band cryocooled sapphire oscillator
Author: Nand, N.R.
Hartnett, J.G.
Citation: 2010 IEEE International Frequency Control Symposium, FCS 2010, 2010, pp.670-673
Publisher: IEEE
Issue Date: 2010
ISBN: 9781424463992
Conference Name: 2010 IEEE International Frequency Control Symposium (FCS 2010) (1 Jun 2010 - 4 Jun 2010 : Newport Beach, CA)
Statement of
Responsibility: 
Nitin R. Nand and John G. Hartnett
Abstract: A previously implemented cryogenic sapphire oscillator (CSO) based on a commercial cryocooler has been modified and its frequency stability and phase noise re-measured against a nominally similar liquid helium cooled CSO in the same laboratory. Assuming both contribute equally, their frequency stability and phase noise have been evaluated. We report for the oscillator a minimum Allan deviation of 3.9 × 10-16 at 20 s, a long-term frequency drift less than 1 × 10-14/day, and a measured single sideband phase noise of -97 dBc/Hz at 1 Hz offset from the carrier. The stated performance of the cryocooled CSO is adequate for it to be deployed at a local VLBI site for comparison against the hydrogen maser which is the current reference standard.
Rights: © 2010 IEEE
DOI: 10.1109/FREQ.2010.5556243
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