Please use this identifier to cite or link to this item:
https://hdl.handle.net/2440/88680
Citations | ||
Scopus | Web of Science® | Altmetric |
---|---|---|
?
|
?
|
Full metadata record
DC Field | Value | Language |
---|---|---|
dc.contributor.author | Kant, K. | - |
dc.contributor.author | Losic, D. | - |
dc.contributor.editor | Zhiming AWaag, M. | - |
dc.contributor.editor | Salamo, G. | - |
dc.contributor.editor | Kishimoto, N. | - |
dc.contributor.editor | Bellucci, S. | - |
dc.contributor.editor | Park, Y. | - |
dc.date.issued | 2013 | - |
dc.identifier.citation | Lecture notes in nanoscale science and technology, 2013 / Zhiming AWaag, M., Salamo, G., Kishimoto, N., Bellucci, S., Park, Y. (ed./s), pp.1-22 | - |
dc.identifier.isbn | 9783319028736 | - |
dc.identifier.uri | http://hdl.handle.net/2440/88680 | - |
dc.description.statementofresponsibility | Krishna Kant and Dusan Losic | - |
dc.language.iso | en | - |
dc.publisher | Springer | - |
dc.rights | © Springer International Publishing Switzerland 2013 | - |
dc.source.uri | http://dx.doi.org/10.1007/978-3-319-02874-3_1 | - |
dc.subject | Focused ion beam; Micro- and nanofabrications; Ion milling; Deposition; Nanopore array | - |
dc.title | Focused Ion Beam (FIB) technology for micro-and nanoscale fabrications | - |
dc.type | Book chapter | - |
dc.identifier.doi | 10.1007/978-3-319-02874-3_1 | - |
dc.publisher.place | Switzerland | - |
pubs.publication-status | Published | - |
dc.identifier.orcid | Losic, D. [0000-0002-1930-072X] | - |
Appears in Collections: | Aurora harvest 7 Chemical Engineering publications |
Files in This Item:
There are no files associated with this item.
Items in DSpace are protected by copyright, with all rights reserved, unless otherwise indicated.