Please use this identifier to cite or link to this item: https://hdl.handle.net/2440/88680
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dc.contributor.authorKant, K.-
dc.contributor.authorLosic, D.-
dc.contributor.editorZhiming AWaag, M.-
dc.contributor.editorSalamo, G.-
dc.contributor.editorKishimoto, N.-
dc.contributor.editorBellucci, S.-
dc.contributor.editorPark, Y.-
dc.date.issued2013-
dc.identifier.citationLecture notes in nanoscale science and technology, 2013 / Zhiming AWaag, M., Salamo, G., Kishimoto, N., Bellucci, S., Park, Y. (ed./s), pp.1-22-
dc.identifier.isbn9783319028736-
dc.identifier.urihttp://hdl.handle.net/2440/88680-
dc.description.statementofresponsibilityKrishna Kant and Dusan Losic-
dc.language.isoen-
dc.publisherSpringer-
dc.rights© Springer International Publishing Switzerland 2013-
dc.source.urihttp://dx.doi.org/10.1007/978-3-319-02874-3_1-
dc.subjectFocused ion beam; Micro- and nanofabrications; Ion milling; Deposition; Nanopore array-
dc.titleFocused Ion Beam (FIB) technology for micro-and nanoscale fabrications-
dc.typeBook chapter-
dc.identifier.doi10.1007/978-3-319-02874-3_1-
dc.publisher.placeSwitzerland-
pubs.publication-statusPublished-
dc.identifier.orcidLosic, D. [0000-0002-1930-072X]-
Appears in Collections:Aurora harvest 7
Chemical Engineering publications

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