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https://hdl.handle.net/2440/95328
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Type: | Journal article |
Title: | Analysis of scan blindness in a linearly polarized tapered-slot phased array in triangular lattice - performance improvement with parasitic notches |
Author: | Xu, Z. Zhang, C. Kaufmann, T. Yan, X. Yuan, Y. Fumeaux, C. |
Citation: | IEEE Transactions on Antennas and Propagation, 2014; 62(8):4057-4066 |
Publisher: | IEEE |
Issue Date: | 2014 |
ISSN: | 0018-926X 1558-2221 |
Statement of Responsibility: | Zhi Xu, Chuanfang Zhang, Thomas Kaufmann, Xuequan Yan, Yuan Yuan, and Christophe Fumeaux |
Abstract: | Various types of scan blindness are analyzed in a single-polarized tapered-slot phased array with triangular lattice arrangement, and a scan blindness removal strategy is proposed. In the presented analysis, two types of scan blindness are observed which have not been previously reported. First, a special case of parallel plate cavity resonance is demonstrated to cause scan blindness at a fixed frequency for E-plane scanning. Second, another cause for E-plane scan blindness is extended from previous observations, by including the fundamental mode of a half-mode open waveguide. This type of leaky-wave-induced scan blindness is limited to triangular lattices and can occur at lower frequencies compared to other types of leaky-wave blindness. In the second part of this paper, parasitic notches are proposed as an effective measure to significantly improve the E-plane scanning characteristics of the considered array by reducing the magnitude of the leaky modes. As a beneficial side-effect, these parasitic notches are also proven to improve the H-plane scanning characteristics by suppressing resonances within the stripline substrate cavity of the individual tapered-slot elements. Numerical simulations and measurements performed on a 169-element array prototype validate the analysis and confirm the effectiveness of the proposed concept for scan blindness suppression. |
Keywords: | Leaky-wave mode phased array scan blindness tapered-slot antenna |
Rights: | © 2014 IEEE |
DOI: | 10.1109/TAP.2014.2322894 |
Published version: | http://dx.doi.org/10.1109/tap.2014.2322894 |
Appears in Collections: | Aurora harvest 7 Electrical and Electronic Engineering publications |
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