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Type: Journal article
Title: Analysis of scan blindness in a linearly polarized tapered-slot phased array in triangular lattice - performance improvement with parasitic notches
Author: Xu, Z.
Zhang, C.
Kaufmann, T.
Yan, X.
Yuan, Y.
Fumeaux, C.
Citation: IEEE Transactions on Antennas and Propagation, 2014; 62(8):4057-4066
Publisher: IEEE
Issue Date: 2014
ISSN: 0018-926X
Statement of
Zhi Xu, Chuanfang Zhang, Thomas Kaufmann, Xuequan Yan, Yuan Yuan, and Christophe Fumeaux
Abstract: Various types of scan blindness are analyzed in a single-polarized tapered-slot phased array with triangular lattice arrangement, and a scan blindness removal strategy is proposed. In the presented analysis, two types of scan blindness are observed which have not been previously reported. First, a special case of parallel plate cavity resonance is demonstrated to cause scan blindness at a fixed frequency for E-plane scanning. Second, another cause for E-plane scan blindness is extended from previous observations, by including the fundamental mode of a half-mode open waveguide. This type of leaky-wave-induced scan blindness is limited to triangular lattices and can occur at lower frequencies compared to other types of leaky-wave blindness. In the second part of this paper, parasitic notches are proposed as an effective measure to significantly improve the E-plane scanning characteristics of the considered array by reducing the magnitude of the leaky modes. As a beneficial side-effect, these parasitic notches are also proven to improve the H-plane scanning characteristics by suppressing resonances within the stripline substrate cavity of the individual tapered-slot elements. Numerical simulations and measurements performed on a 169-element array prototype validate the analysis and confirm the effectiveness of the proposed concept for scan blindness suppression.
Keywords: Leaky-wave mode; phased array; scan blindness; tapered-slot antenna
Rights: © 2014 IEEE
RMID: 0030007052
DOI: 10.1109/TAP.2014.2322894
Appears in Collections:Electrical and Electronic Engineering publications

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