Noise reduction in terahertz thin film measurements using a double modulated differential technique

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dc.contributor.authorMickan, S.
dc.contributor.authorAbbott, D.
dc.contributor.authorMunch, J.
dc.contributor.authorZhang, X.
dc.date.issued2002
dc.description© World Scientific Publishing Company
dc.description.abstractDifferential terahertz (THz) time-domain spectroscopy (TDS) is a technique for decreasing noise levels in THz thin film characterization experiments. Characterizing thin films in the GHz to THz range is critical for the development of fast integrated circuits and photonic systems, and is potentially applicable to biosensors and proteomics. This paper shows how the differential technique, combined with double modulation, enables the study of thin films with noise reduction over normal TDS that improves at the film gets thinner. Double modulated differential THz-TDS has enabled the characterization of films with less than 1-μm thickness.
dc.description.statementofresponsibilitySamuel P. Mickan, Derek Abbott, Jesper Munch and X.-C. Zhang
dc.identifier.citationFluctuation and Noise Letters, 2002; 2(1):R13-R28
dc.identifier.doi10.1142/S0219477502000609
dc.identifier.issn0219-4775
dc.identifier.issn1793-6780
dc.identifier.orcidAbbott, D. [0000-0002-0945-2674]
dc.identifier.urihttp://hdl.handle.net/2440/12503
dc.language.isoen
dc.publisherWorld Scientific Publishing Co. Pty. Ltd.
dc.source.urihttps://doi.org/10.1142/s0219477502000609
dc.subjectTerahertz
dc.subjectspectroscopy
dc.subjectdouble modulation
dc.subjectthin films
dc.titleNoise reduction in terahertz thin film measurements using a double modulated differential technique
dc.typeJournal article
pubs.publication-statusPublished

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