Labile ferroelastic nanodomains in bilayered ferroelectric thin films
Date
2009
Authors
Anbusathaiah, V.
Kan, D.
Kartawidjaja, F.C.
Mahjoub, R.
Arredondo, M.A.
Wicks, S.
Takeuchi, I.
Wang, J.
Nagarajan, V.
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Advanced Materials, 2009; 21(34):3497-3502
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Abstract
Labile ferroelastic nanodomains in bilayered ferroelectric thin films are analyzed. Bilayered thin-film structures comprising of a PbZr 0.3Ti0.7O3 deposited on top of a PbZr 0.7Ti0.3O3 were used in the experiment. The films were deposited by a multistep sol-gel route assisted by spin coating on Pt/Ti/SiO2/Si substrates. X-Ray-diffraction measurements ysung Philips X-pert MRD verified that the structure of the PZT layers was polycrystalline with a preferential orientation along the (001)/(100) direction with small fraction of (111) orientation. The typical gap between each pad was about 10μm. Ferroelectric hystersis loops and PUND measurements were performed using a Radiant Premier II at room temperature. Cross-sectional TEM analysis was performed using a JEOL 3000F TEM operated at an accelerating voltage of 300 KV.
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Copyright 2009 Wiley