Random numbers from metastability and thermal noise
Date
2005
Authors
Ranasinghe, D.
Lim, D.
Devadas, S.
Abbott, D.
Cole, P.
Editors
Advisors
Journal Title
Journal ISSN
Volume Title
Type:
Journal article
Citation
Electronics Letters, 2005; 41(16):891-893
Statement of Responsibility
D.C. Ranasinghe, D. Lim, S. Devadas, D. Abbott and P.H. Cole
Conference Name
Abstract
Pseudorandom number generators are algorithmic and thus, predictable. Ideally cryptography, simulation and modelling applications require a source of true random numbers. Presented is a true random number generator that exploits metastablity and thermal noise. The novelty is that the low-cost design can be fully integrated with standard CMOS technology.