Improved application of carbon nanotube atomic force microscopy probes using peakforce tapping mode

Simple item page
dc.contributor.authorSlattery, A.
dc.contributor.authorShearer, C.
dc.contributor.authorShapter, J.
dc.contributor.authorBlanch, A.
dc.contributor.authorQuinton, J.
dc.contributor.authorGibson, C.
dc.date.issued2018
dc.description.abstractIn this work PeakForce tapping (PFT) imaging was demonstrated with carbon nanotube atomic force microscopy (CNT-AFM) probes; this imaging mode shows great promise for providing simple, stable imaging with CNT-AFM probes, which can be difficult to apply. The PFT mode is used with CNT-AFM probes to demonstrate high resolution imaging on samples with features in the nanometre range, including a Nioprobe calibration sample and gold nanoparticles on silicon, in order to demonstrate the modes imaging effectiveness, and to also aid in determining the diameter of very thin CNT-AFM probes. In addition to stable operation, the PFT mode is shown to eliminate "ringing" artefacts that often affect CNT-AFM probes in tapping mode near steep vertical step edges. This will allow for the characterization of high aspect ratio structures using CNT-AFM probes, an exercise which has previously been challenging with the standard tapping mode.
dc.description.statementofresponsibilityAshley D. Slattery, Cameron J. Shearer, Joseph G. Shapter, Adam J. Blanch, Jamie S. Quinton and Christopher T. Gibson
dc.identifier.citationNanomaterials, 2018; 8(10):1-13
dc.identifier.doi10.3390/nano8100807
dc.identifier.issn2079-4991
dc.identifier.issn2079-4991
dc.identifier.orcidSlattery, A. [0000-0003-4023-3506]
dc.identifier.orcidShearer, C. [0000-0002-8192-3696]
dc.identifier.orcidGibson, C. [0000-0003-3334-5059]
dc.identifier.urihttp://hdl.handle.net/2440/116697
dc.language.isoen
dc.publisherMDPI
dc.rights© 2018 by the authors. Licensee MDPI, Basel, Switzerland. This article is an open access article distributed under the terms and conditions of the Creative Commons Attribution (CC BY) license (http://creativecommons.org/licenses/by/4.0/).
dc.source.urihttps://doi.org/10.3390/nano8100807
dc.subjectCarbon nanotubes; atomic force microscope tips; tapping mode; PeakForce tapping mode; imaging artefacts
dc.titleImproved application of carbon nanotube atomic force microscopy probes using peakforce tapping mode
dc.typeJournal article
pubs.publication-statusPublished

Files

Original bundle
Now showing 1 - 1 of 1
No Thumbnail Available
Name:
hdl_116697.pdf
Size:
1.4 MB
Format:
Adobe Portable Document Format
Description:
Published version
Download

Collections

Chemical Engineering publications