Modelling of coplanar waveguide transmission lines in multiple metal layer processes
Date
2007
Authors
Heading, E.
Hansen, H.
Parker, M.
Editors
Al-Sarawi, S.
Advisors
Journal Title
Journal ISSN
Volume Title
Type:
Conference paper
Citation
Proceedings of Smart Materials Nano- and Micro-Smart Systems, 2007;. pp.1-7
Statement of Responsibility
E. Heading, H. J. Hansen and M. E. Parker
Conference Name
Smart structures, devices, and systems III (2006 : Adelaide, Australia)
Abstract
Accurate characterisation of transmission lines is essential in enabling the design of Monolithic Microwave Integrated Circuits (MMICs) or Radio Frequency Integrated Circuits (RFICs). One RFIC technology currently being pursued is Silicon on Sapphire Complementary Metal Oxide Semiconductor (CMOS) technology. CMOS processes typically involve stacked metal layer structures and the correct method of modelling coplanar waveguides in CMOS is unclear. This paper reports on preliminary studies into electromagnetic design, with an emphasis on correctly predicting losses associated with these structures.
School/Discipline
Dissertation Note
Provenance
Published online Jan. 11, 2007.
Description
Copyright © 2007 SPIE - The International Society for Optical Engineering. Downloading of the abstract is permitted for personal use only.