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Loss mechanisms for T-ray microwires

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dc.contributor.authorAtakaramians, S.
dc.contributor.authorAfshar Vahid, S.
dc.contributor.authorFischer, B.
dc.contributor.authorAbbott, D.
dc.contributor.authorMonro, T.
dc.contributor.conferenceIRMMW-THz2007 (2007 : Cardiff, Wales)
dc.contributor.editorBob Miles,
dc.date.issued2007
dc.description.abstractIn this paper we will present predictions for loss mechanisms caused by material, waveguide, surface roughness and bends in microwires and estimate their affect on the total loss in the terahertz regime.
dc.identifier.citationJoint 32st International IEEE Conference on Infrared and Millimeter Waves and 15th International Conference on Terahertz Electronics. Proceedings of IRMMW-THz2007, 2-9 September, 2007. pp. 811-812
dc.identifier.doi10.1109/icimw.2007.4516743
dc.identifier.isbn1424414393
dc.identifier.isbn9781424414383
dc.identifier.orcidAbbott, D. [0000-0002-0945-2674]
dc.identifier.urihttp://hdl.handle.net/2440/44746
dc.language.isoen
dc.publisherIEEE
dc.publisher.placeCDROM
dc.source.urihttp://www.ieeexplore.ieee.org//xpls/abs_all.jsp?arnumber=4516743
dc.titleLoss mechanisms for T-ray microwires
dc.typeConference paper
pubs.publication-statusPublished

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