Nand, N.Parker, S.Ivanov, E.Le Floch, J.Hartnett, J.Tobar, M.2013-09-092013-09-092013Applied Physics Letters, 2013; 103(4):043502-1-043502-40003-69511077-3118http://hdl.handle.net/2440/79823We report on the measurement and characterization of power to frequency conversion in the resonant mode of a cryogenic sapphire loaded cavity resonator, which is used as the frequency discriminating element of a loop oscillator circuit. Fluctuations of power incident on the resonator lead to changes in radiation pressure and temperature in the sapphire dielectric, both of which contribute to a shift in the resonance frequency. We measure a modulation and temperature independent radiation pressure induced power to frequency sensitivity of −0.15 Hz/mW and find that this is the primary factor limiting the stability of the resonator frequency.en© 2013 AIP Publishing LLCJournal article002013102810.1063/1.48162840003224066001152-s2.0-8488499752418476