Slattery, A.Shearer, C.Shapter, J.Blanch, A.Quinton, J.Gibson, C.2018-12-102018-12-102018Nanomaterials, 2018; 8(10):1-132079-49912079-4991http://hdl.handle.net/2440/116697In this work PeakForce tapping (PFT) imaging was demonstrated with carbon nanotube atomic force microscopy (CNT-AFM) probes; this imaging mode shows great promise for providing simple, stable imaging with CNT-AFM probes, which can be difficult to apply. The PFT mode is used with CNT-AFM probes to demonstrate high resolution imaging on samples with features in the nanometre range, including a Nioprobe calibration sample and gold nanoparticles on silicon, in order to demonstrate the modes imaging effectiveness, and to also aid in determining the diameter of very thin CNT-AFM probes. In addition to stable operation, the PFT mode is shown to eliminate "ringing" artefacts that often affect CNT-AFM probes in tapping mode near steep vertical step edges. This will allow for the characterization of high aspect ratio structures using CNT-AFM probes, an exercise which has previously been challenging with the standard tapping mode.en© 2018 by the authors. Licensee MDPI, Basel, Switzerland. This article is an open access article distributed under the terms and conditions of the Creative Commons Attribution (CC BY) license (http://creativecommons.org/licenses/by/4.0/).Carbon nanotubes; atomic force microscope tips; tapping mode; PeakForce tapping mode; imaging artefactsJournal article003010050610.3390/nano81008070004511741000632-s2.0-85055548337443634Slattery, A. [0000-0003-4023-3506]Shearer, C. [0000-0002-8192-3696]Gibson, C. [0000-0003-3334-5059]