Withayachumnankul, W.Ferguson, B.Rainsford, T.Mickan, S.Abbott, D.2006-12-032006-12-032005Electronics Letters, 2005; 41(14):800-8010013-51941350-911Xhttp://hdl.handle.net/2440/16586© 2005 Institution of Engineering and TechnologyA simple and precise method based on fixed-point iteration is used to estimate dielectric parameters using terahertz time-domain spectroscopy (THz-TDS). The method converges and gives correct parameters when the sample thickness is greater than 200 mm at a frequency of 0.1 THz or 20 mm at a frequency of 1.0 THz. The technique in validated using measured terahertz data, obtained by probing a sample of high-resistivity silicon.enJournal article002005072410.1049/el:200514670002305608000152-s2.0-2294447771554841Withayachumnankul, W. [0000-0003-1155-567X]Abbott, D. [0000-0002-0945-2674]