Clare, B.Corbett, K.Grant, K.Atanackovic, P.Marwood, W.Munch, J.2006-12-062006-12-062003Journal of Lightwave Technology, 2003; 21(11):2883-28900733-87241558-2213http://hdl.handle.net/2440/18127A simulation of S-SEED switching based upon experimental data is developed that includes the effect of critical slowing down. The simulation's accuracy is demonstrated by close agreement with the results from experimental S-SEED switching. The simulation is subsequently used to understand how the phenomenon of critical slowing down applies to switching of an S-SEED and how the effect on photonic analog-to-digital (A/D) converter performance may be minimized.en© 2003 IEEE.Critical slowing downoptical bistabilityself-electrooptic-effect device (SEED)Journal article002003111710.1109/JLT.2003.8177130001870645000452-s2.0-034697250858380