Rahman, M.Jiang, Z.Duan, X.Xie, Z.Tadich, A.Zhou, Z.Mondinos, N.Yin, C.Altarawneh, M.Dlugogorski, B.2018-09-282018-09-282016Journal of Alloys and Compounds, 2016; 661:268-2730925-83881873-4669http://hdl.handle.net/2440/114737Abstract not availableen© 2015 Elsevier B.V. All rights reserved.CrNₓ coatings; doping; synchrotron radiation; NEXAFS; electronic structure; sputtering; grain boundaryNEXAFS N K-edge study of the bonding structure on Al/Si doped sputtered CrN coatingsJournal article003004094010.1016/j.jallcom.2015.11.1280003675212000402-s2.0-84949599636226282