Cheng, A.Lim, C.2014-02-062014-02-062014Journal of Industrial and Management Optimization, 2014; 10(2):383-3961547-58161553-166Xhttp://hdl.handle.net/2440/81923Verification of semiconductor chip designs is commonly driven by single goal orientated measures. With increasing design complexities, this approach is no longer effective. We enhance the effectiveness of coverage driven design verifications by applying multi-objective optimization techniques. The technique is based on genetic evolutionary algorithms. Difficulties with conflicting test objectives and selection of tests to achieve multiple verification goals in the genetic evolutionary framework are also addressed.enCopyright status unknownMulti-objective optimizationgenetic evolutionary algorithmsPareto optimizationsystem-on-chip verificationcoverage driven verification.Journal article002013361810.3934/jimo.2014.10.3830003269321000022-s2.0-8488674258416944Lim, C. [0000-0002-2463-9760]